Design Automation And Test In Europe
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In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and desig
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DATE 12: Design, Automation and Test in Europe Mar 12, 2012-Mar 16, 2012 Dresden, Germany. You can view more information about this proceeding and all of ACM�
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The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design
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